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    PHOCUSCAN: High-Precision Photocurrent Mapping System

    The PHOCUSCAN is a compact, high-performance scanning photocurrent microscope (SPCM) purpose-built for accurate photocurrent mapping and device analysis. With sub-100 nm laser scanning resolution and dual-mode operation, it enables both brightfield imaging and real-time electrical measurements in a single platform.
    Designed for versatility, PHOCUSCAN supports the full VIS–NIR range (400–1000 nm) using a super-apochromatic optical system and offers seamless compatibility with Keithley 2400/2600 series source-meters. It includes ultra-smooth multi-axis micro-positioners, an interchangeable chopper module, and a vacuum chuck stage for stable, precise sample handling.

    Overview

    XperRAM C Series is by far one of the most compact, budget friendly micro Raman instrument products in the market. The laser scanning module in XperRAM C Series offers the widest scanning experience in the market with 200 µm x 200 µm scanning area on 40X objective.

    With XperRAM C Series, you can only have one laser equipped (usually 532 nm laser), but the quantum efficiency goes maximum (almost 80% at 532 nm wavelength) with the custom-made detector and spectrometer, so acquisition of precise Raman data is guaranteed with XperRAM C Series.

    Key Features

      • High-Precision laser scanning photocurrent mapping
      • Dual-Mode vision & measurement system
      • Ultra-Smooth micropositioning System
      • Versatile optical platform for the entire VIS–NIR wavelengths
      • Fully compatible with Keithley 2400/2600 series SMUs

    Specifications

    Products PHOCUSCAN
    Main System Fiber Coupling Port FC/PC
    Wavelength 400–1000 nm
    Spectral Linewidth 2–3 nm (depending on wavelength)
    Max. Power 50–100 mW (depending on wavelength)
    Lens Options 5X, 10X, 20X, 40X
    Beam Quality Depth of Field 0.9 μm (@ 532 nm, 40X)
    Spot Diameter 0.9 μm (@ 532 nm, 40X)
    Optical Modulation Power Control 100% ~ 0.01%
    Polarizer O
    Half-Waveplate O
    Quarter-Waveplate O
    Optical Chopper 20–1000 Hz or 200–10 kHz
    Mapping Performance (Galvo Scanner) Max. Scan Range 200 μm × 200 μm (@ 40X)
    Max. Step Resolution < 0.1 μm
    Repeatability < 1.0 μm
    SMU Options SMU Keithley 2400 or 2600 series
    Multi-axis Micro-positioner Max. Four (BNC or TRX)

    Applications

    • Nanoscale Electronic Material Characterization
    • Photovoltaic Device & Thin Film Solar Cell Testing
    • Optical Component and Laser Device Evaluation
    • Semiconductor Device Quality Control and Failure Analysis

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