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    QE-RX: IPCE Measurement & Loss Analyzer.

    QE-RX is a photovoltaic cell efficiency loss analyzer for high-efficiency solar cell research and development. The loss mechanism is the key information to improve the conversion efficiency of high-efficiency solar cells such as PERC, HJT, TOP-Con, etc. Conversion efficiency losses can be attributed to three factors, including short-circuit current density (Jsc), open-circuit voltage (Voc), and fill factor (FF) losses. The QE-RX can not only measure PV-EQE, reflectance, and PV-IQE data, but also analyze Jsc, Voc, and FF losses in conjunction with the analysis software SQ-JVFLA. Enlitech integrated three different test functions in QE-RX and developed SQ-JVFLA software to help users analyze three different losses based on Shockley–Queisser thermal limit theory. QE-RX is your best partner for improving photovoltaic efficiency.

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    Overview

    • QE-RX is a PV cell efficiency-loss analyzer for high-efficiency solar cell research and development.
    • Since 2015, the loss mechanism has been key information for improving the conversion efficiency of PERC, HJT, TOP-Con, and other highly efficient solar cells.
    • Conversion efficiency loss can be attributed to three factors:
    • short-circuit current density (Jsc),
    • open-circuit voltage (Voc), and
    • fill-factor (FF) losses.
    • QE-RX can not only measure PV-EQE, Reflectance, and PV-IQE data but also analyze Jsc, Voc, and FF losses by combining the analysis software SQ-JVFLA.
    • Enlitech integrates three different testing functions within QE-RX and develops SQ-JVFLA software to help users analyze three different losses using the Shockley-Queisser thermal limit theory.
    • QE-RX is your best partner for boosting PV efficiency.

    Key Features

    • Compact design with integrated optical, mechanical, and electronic components inside an 80 × 80 × 92 cm main body.
    • For PESC, PERC, PERL, HJT, back-contact, bi-facial and TOP-Con Si solar cells
    • Provide the data in QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE (incident photon-to-electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency), and Reflectance.
    • High Repeatability over 99.5%
    • wavelength range: 300~1200 nm
    • Jsc Loss Analysis and report (with SQ-JVFLA software)
    • Voc Loss Analysis and report (with SQ-JVFLA software)
    • FF Loss Analysis and report (with SQ-JVFLA software)
    • Variety and customized sample test fixtures.

    Specifications

    Parameter Specification
    Applicable Solar Cell Types PESC, PERC, PERL, HJT, back-contact, bi-facial, and TOP-Con Si solar cells
    Data provided QE (quantum efficiency), PV-EQE (external quantum
    efficiency), IPCE (incident photon-to-electron conversion efficiency), SR
    (spectral response), IQE (internal quantum efficiency), and Reflectance.
    Compactness and Repeatability Compact size with high repeatability over 99.5%
    Wavelength Range 300 nm to 1200 nm
    Jsc Loss Analysis Report provided with SQ-JVFLA software
    Voc Loss Analysis Report provided with SQ-JVFLA software
    FF Loss Analysis Report provided with SQ-JVFLA software
    Sample Test Fixtures Variety of customizable sample test fixtures available

    Applications

    • PERC/ HJT/ TOP-Con PV Solar Cell Efficiency-Loss Analysis.
    • IEC-60904-8 Spectral Response measurement.
    • IEC-60904-7 Mismatch Factor calculation.
    • IEC-60904-1 MMF Correction.
    • Si solar cell processing quality control.
    • Si solar cell bandgap determination.

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