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    XPER RAM S: Higher performance all-in-one system for Raman and TRPL analysis

    The XperRAM-S Series is a high-performance Raman spectroscopy platform designed for precise and flexible analysis. It supports up to three laser wavelengths (405–1064 nm) and comes in three models—S-VWR, S-VHR, and S-NIR—optimized for wide-range or high-resolution measurements. With interchangeable gratings (up to 2400 l/mm) and high-resolution XPE200 spectrometers, it enables fine spectral control and broad spectral coverage. Built on the Olympus BX43 microscope, the system offers sub-micron spatial resolution and supports advanced features such as auto-focus, motorized stage, and in-situ photocurrent measurement.

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    Overview

    XperRAM S Series is built with a versatile set of transmission spectrometer and high performance detector that provides a high peak efficiency for a wide range of wavelengths covering 405, 532, 633, and 785 nm (1064 nm also available through customization).

    Not only that, XperRAM S Series also offers the widest scanning experience in the market with 200 µm x 200 µm scanning area on 40X objective.

    The modular concept of the product enables easy customization such as system modification and system integration with other instruments.

    Key Features

    • Confocal Raman spectrum and mapping
    • Time-resolved photoluminescence (TRPL) measurement and mapping
    • In-situ photocurrent measurement and mapping
    • Bright and dark field microscopic imaging
    • Additional laser wavelength flexibility via fiber coupling
    • Support up to three laser wavelengths (405, 457, 532, 633, 785, 1064 nm)

    Specifications

    Products XperRAM-S Series S-VWR
    (VIS, Wide Range)    		 S-VHR
    (VIS, High Resolution)    		 S-NIR
    (NIR)
    Number of Lasers Up to three Up to three Up to three
    Laser Wavelength
    (● recommended)    		 405 nm ○ ○ –
    457 nm ○ ○ –
    532 nm ● ● –
    633 nm ○ ○ –
    785 nm ○ – –
    1064 nm – – ●
    Fiber Coupling Port ○ ○ ○
    Spectrometer XPE200 XPE400 XPE200
    Grating Options 300, 600, 1200, 1800, 2400 600, 1200, 1800, 2400 181, 300
    Microscope System Body BX43 (Upright) BX43 (Upright) BX43 (Upright)
    Depth of Field < 1 µm < 1 µm < 1 µm
    Spatial Resolution < 1 µm < 1 µm < 1 µm
    Recommended Grating 1800 lpmm 1200 lpmm 300 lpmm
    Spectrum Performance Spectral Range 50–2240 cm⁻¹ (532 nm) 50–1900 cm⁻¹ (532 nm) 50–2670 cm⁻¹ (1064 nm)
    Spectral Resolution (FWHM @ center) 2.3 cm⁻¹ (532 nm) 2.0 cm⁻¹ (532 nm) 3.6 cm⁻¹ (1064 nm)
    Spectral Resolution (cm⁻¹/pixel) 1.1 cm⁻¹ (532 nm) 0.9 cm⁻¹ (532 nm) 2.5 cm⁻¹ (1064 nm)
    Mapping Performance
    (Galvo Scanner)    		 Automatic Mapping based on SMART™ Mapping (requires motorized stage option)
    Automatic laser focus adjustment (532 nm, 633 nm)
    Max. Scan Range 200 µm (40X objective) 200 µm (40X objective)
    Step Resolution 100 nm 100 nm
    Repeatability < 1 µm < 1 µm
    Integration Options Motorized Stage ○ ○
    FLIM ○ ○
    Cooling / Heating Stage ○ ○ ○
    In-situ Photocurrent ○ ○ ○
    In-situ Battery Cycle ○ ○ ○

    Applications

    • Material Science: Thin films, nanomaterials, composites
    • Life Science: Cells, biomolecules, label-free detection
    • Pharmaceuticals: API analysis, impurities, polymorphs
    • Cosmetics: Ingredients, stability, skin penetration
    • Semiconductors: Contamination, stress, microstructures

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