Trokut Solutions

  • Contact Us
  • FAQs
Facebook Twitter Youtube Instagram Linkedin Whatsapp Icon-phone-handset

    Please Submit Form & Get Pdf



    Download PDF
    XPER RF zoom

    Hover

    XPER RF
    Full Screen

    XPER RF: Raman Spectroscopy and TRPL Measuring Instrument

    XperRF is a two-in-one instrument with a focus on enhanced material analysis. The instrument has a Raman spectroscopy module and a TRPL measurement module, both of which offer useful techniques to determine characteristics of a material. It’s rather easy to note that this instrument is a combination of XperRAM S Series and Xper-FLIM. With XperRF, you can enjoy all the high efficiency features of XperRAM S Series which includes high performance spectrometer and detector plus a wide and fast scanning scanner module. For a TRPL measurement module, Nanobase collaborates with PicoQuant, a renowned company from Berlin, Germany, to maximize the measuring quality.

     

    Download Data SheetEnquiry Now

    Key Features

    • Raman spectrum acquisition and imaging.
    • Fast 2D scanning.
    • Bright field microscopic imaging.
    • Up to three laser/filter selections.
    • Interchangeable and rotatable volume phase holographic (VPH) grating selections.
    • Photoluminescence (PL).
    • Electroluminescence (EL).
    • Time-Resolved Photoluminescence (TRPL).

    Specifications

    XPE 200 Monochromator
    • Input aperture ratio: f/5.
    • Focal length: 200 mm.
    • Spectral range: Max. 8430 cm-1
    • Spectral resolution (FWHM): Min. 2.9 cm-1
    • Grating options:
      • 300 lp/mm at 900 nm
      • 600 lp/mm at 600 nm
      • 1200 lp/mm at 840 nm
      • 1800 lp/mm at 532 nm
      • 2400 lp/mm at 450 nm
    Detector
    • Back-illuminated CCD
    • Active pixels: 2000 × 256 pixels
    • Pixel size: 15 × 15 μm
    • Dark current: As low as 0.033 e–/pixel/sec
    • Quantum efficiency: >40% from 400 nm to 1000 nm
    Objectives Laser Scanning Module
    • Default: 40X, NA 0.75, WD 0.63 mm
    • Optional: 10X, 20X, 50X, 100X, Long WD 20X, Long WD 40X
    • Scanning mode: Raster scan
    • Positioning accuracy: 20 nm
    • Scanning size: 200 μm × 200 μm (40X objective)
    • 400 μm × 400 μm (20X objective)
    Raman Lasers Raman Filters
    • 532 nm Freespace
    • 405 nm Freespace
    • 633 nm Freespace
    • 785 nm Freespace
    • 1064 nm Freespace (via customization)
    • 532 nm filter
    • 405 nm filter
    • 633 nm filter
    • 785 nm filter
    • 1064 nm filter (via customization)

    Applications

    • Biology/Medical research
    • Solar cell efficiency analysis

    Get in Touch

    Please fill out the form and we will get back to
    you within 24 hours.

    Write to Us

    Our friendly team is here to help.

    info@trokutsolutions.com

    Call Us

    Our friendly team is here to help.

    (+91) (022) 40124404

    Reach Out to Trokut Solutions

    Welcome to Trokut Solutions. Please use this form to submit your enquiries


      Scroll to Top