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    REPS: Voc-Loss Analyzer

    The REPS_Ultra from Enlitech is a Voc-loss analyzer designed specifically for perovskite and organic photovoltaic research. It can detect extremely low EL-EQE signals (as low as 10⁻⁶%, which is 8 orders of magnitude) and calculate thermodynamic Voc, radiative recombination Voc, and non-radiative recombination Voc, providing a comprehensive analysis to help researchers push the boundaries of solar cell efficiency. To push the conversion efficiency to the limits of thermodynamics, organic and perovskite solar cells strive to increase the open-circuit voltage (Voc) to the Shockley-Queisser limit. The REPS_Ultra supports this goal by enabling precise measurement, calculation, and analysis of Voc-loss in working solar cells, offering clear insights for further performance improvement.
    With its ability to detect extremely weak light brightness as low as 10⁻⁶ nit with an 8-order-of-magnitude dynamic range, REPS_Ultra is especially well suited for organic and novel materials research, helping research teams explore scientific limits. It can also complete a 40-point scan in just 30 seconds, significantly improving research efficiency.

    Overview

    • To push the conversion efficiency to the limits of thermodynamics, organic solar cells and perovskite solar cells strive to increase the open-circuit voltage (Voc) to the Shockley-Queisser limit.
    • The newly designed REPS_Ultra is a comprehensive system that helps scientists measure, calculate, and analyze the Voc-loss in working solar cells, providing suggestions for improvement in the next step.
    • Exploring Scientific Limits:
    • Exceptional Weak Light Detection:
    • Enhanced Measurement Speed:

    Key Features

     

    • It can measure: absolute EL-EQE, EL spectra(V), JV curve, EQE-J.
    • The software can display the charts including: EL-EQE, multi-EL-spectra, JVL curve, Voc loss histogram chart.
    • The system can calculate and analyze thermodynamic Voc, radiative recombination Voc, and non-radiative recombination Voc.
    • The wavelength detection range: 300~1100nm; and can be extended (option).
    • NIST-traceable absolute radiometric calibration (Watt, from 300~1100nm).
    • EL-EQE detection range: 1 x 10-6% (8 orders).
    • EL-EQE repeatability >99%.
    • EL-EQE reproducibility >99%.
    • Glove Box integration toolkit.
    • Customized test fixtures.

    Specifications

     

    Parameter Specification
    Wavelength range 300 – 1100 nm
    Wavelength resolution 1 nm (depending on slit and grating)
    Exposure time 5 ms – 60 s

    Applications

    • OPV Voc-loss Improvement.
    • Perovskite Voc-loss Improvement.
    • Charge Transfer State Identification.

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