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SG-A from Enlitech is a CMOS Image Sensor Tester that can provide the most comprehensive CMOS image sensor parameter characterization, including full-spectrum quantum efficiency (QE), overall system gain (K), temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, linearity error, and chief-ray angle (CRA).
The device under test can be various types of CMOS image sensor modules, with inspection procedures compliant with the EMVA 1288 standard. The SG-A CMOS image sensor tester can be used for wafer-level optics inspection, process parameter control, micro-lens design, and micro-lens verification. Its highly collimated beam (< 1°) can overcome the inspection difficulties of new manufacturing processes that traditional optical systems, such as integrating sphere systems, cannot solve. The processes include small pixel sizes (< 1 µm), BSI and 3D stacking, micro-lens, new Bayer array designs, and so on.
CMOS Image Sensor Tester: The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations, such as full-spectrum quantum efficiency QE, overall system gain K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA.
| Item | Specification |
|---|---|
| Full-spectrum Wavelength Range | 300–1100 nm or 350–1000 nm (PTC) |
| Extended Wavelength Range | Extendable up to 1700 nm or more |
| Single Wavelength Source | 470 nm, 530 nm, 630 nm, 940 nm (±5 nm), or customized |
| Dynamic Range | 80 dB, 100 dB, or 140 dB |
| Test Fixtures | DUT ≤ 100 mm × 100 mm × 30 mm (Height), basic type or customized |
| Stage Options | Non; manual 3-axis; or 6-axis (manual + automatic), customizable |
Can test CMOS image sensor parameters:
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