SG-A: CMOS Image Sensor Tester

SG-A from Enlitech is a CMOS Image Sensor Tester that can provide the most comprehensive CMOS image sensor parameter characterization, including full-spectrum quantum efficiency (QE), overall system gain (K), temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, linearity error, and chief-ray angle (CRA).
The device under test can be various types of CMOS image sensor modules, with inspection procedures compliant with the EMVA 1288 standard. The SG-A CMOS image sensor tester can be used for wafer-level optics inspection, process parameter control, micro-lens design, and micro-lens verification. Its highly collimated beam (< 1°) can overcome the inspection difficulties of new manufacturing processes that traditional optical systems, such as integrating sphere systems, cannot solve. The processes include small pixel sizes (< 1 µm), BSI and 3D stacking, micro-lens, new Bayer array designs, and so on.