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QFLS MAPER: Quasi-Fermi Level Splitting Detector

QFLS-Maper from Enlitech is a Quasi-Fermi Level Splitting detector capable of visually displaying QFLS images, allowing you to instantly comprehend a complete overview of sample QFLS, Pseudo J-V, PLQY, and EL-EQE. It predicts material efficiency limits in as fast as 2 minutes through Pseudo J-V and reveals Quasi-Fermi level distribution in just 3 seconds enabling rapid evaluation of photovoltaic material potential.

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Overview

  • The laser scanning defect imager is an upgraded version of the Laser Beam Induced Current (LBIC) test.
  • It utilizes a laser beam with a wavelength energy greater than the semiconductor bandgap to irradiate the semiconductor, generating electron-hole pairs.
  • By rapidly scanning the surface of the sample, it obtains an image distribution that reveals changes in internal current to analyze various defect distributions.
  • This helps in analyzing the quality of sample preparation and aids in process improvement.

Key Features

  • Predict Material Performance Limits:

    • 3 seconds to obtain QFLS visualization

    • 2 minutes to measure Pseudo J-V

    • Quickly determine your solar material’s iVoc, optimal I-V curve, and predict material performance limits

  • Visualize:

    • QFLS image visually displays the overall Quasi-Fermi level distribution in materials, revealing material quality at a glance

  • Multi-Modal Functionality:

    • Capable of measuring key solar cell parameters including:

      • QFLS

      • iVoc

      • Pseudo J-V

      • PL image

      • PLQY

      • EL image

      • EL-EQE

      • and more

Specifications

Item Specifications
Spectral Detection Range • 580 nm – 1100 nm (520 nm laser wavelength)
Optical Intensity Dynamic Range • 1/10000 (10-4) ~ 15 Sun (≥ 5 orders)
• PLQY 1E-4% ~ 100% (≥ 6 orders)
Measurement Speed • QFLS imaging: < 3 seconds
• Pseudo JV curve: as fast as < 2 minutes
Scanning Type • Full-field image scanning
Multi-modal Function Modules • QFLS
• QFLS image
• iVOC
• Pseudo J-V
• PLQY
• PLQY image
• In Situ PL
• EL-EQE
• EL image

Applications

Suitable Samples

  • Single-junction perovskite solar cells
  • Perovskite thin film materials

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